سلام
=== START OF INFORMATION SECTION ===
Model Family: Toshiba 2.5" HDD MK..52GSX
Device Model: TOSHIBA MK3252GSX
Serial Number: 987BC5SHT
LU WWN Device Id: 5 000039 143801654
Firmware Version: LV010M
User Capacity: 320,072,933,376 bytes [320 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6, 1.5 Gb/s
Local Time is: Sun May 10 20:41:57 2015 IRDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 135) minutes.
SCT capabilities: (0x0039) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1605
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 5250
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 11
7 Seek_Error_Rate 0x000b 100 099 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 094 094 000 Old_age Always - 2706
10 Spin_Retry_Count 0x0033 204 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 4276
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 793
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 28049575
193 Load_Cycle_Count 0x0032 095 095 000 Old_age Always - 56476
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 43 (Min/Max 12/57)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 11
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 8324
222 Loaded_Hours 0x0032 096 096 000 Old_age Always - 1832
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 259
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2 occurred at disk power-on lifetime: 2695 hours (112 days + 7 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 d7 5a 71 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00715ad7 = 7428823
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 a8 30 57 71 e0 00 01:05:04.969 WRITE DMA EXT
35 00 40 f0 53 71 e0 00 01:05:04.958 WRITE DMA EXT
35 00 20 d0 50 71 e0 00 01:05:04.949 WRITE DMA EXT
35 00 00 d0 4c 71 e0 00 01:05:04.936 WRITE DMA EXT
35 00 00 d0 48 71 e0 00 01:05:04.923 WRITE DMA EXT
Error 1 occurred at disk power-on lifetime: 2552 hours (106 days + 8 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 7f 45 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x0000457f = 17791
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
35 00 60 20 44 00 e0 00 00:00:47.023 WRITE DMA EXT
ca 00 08 d0 43 00 e4 00 00:00:47.018 WRITE DMA
ca 00 20 40 42 00 e4 00 00:00:47.017 WRITE DMA
ca 00 78 c0 41 00 e4 00 00:00:47.017 WRITE DMA
ca 00 08 a0 41 00 e4 00 00:00:47.013 WRITE DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Completed without error 00% 2526 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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